ProSEM Webinar on Metrology

We are pleased to invite you to our ProSEM Webinar, which highlights established and new features for SEM image metrology. This includes advanced feature detection and measurements employing contour extraction, new capabilities for analysis of arrays or edge roughness, layout-based applications for placement analysis or process modeling, and recipes for batch processing of image sets.

To present the metrology capabilities of ProSEM, we would like to invite you to a 45 minute webinar followed by a Q&A session.

Considering the different time zones, we will hold the webinar at 2 timeslots for USA/ European attendees and European/ Asian attendees:

Webinar ProSEM USA/EU:   Tuesday, May 7, 2024 at          9:00am PST / 12:00pm EST / 6:00pm CEST

Webinar ProSEM EU/AP:     Wednesday, May 22, 2024 at   9:00am CEST / 3:00pm CST / 4:00pm JST

Platform: Microsoft TEAMS

(The link will be sent after registration, shortly before the webinar)

REGISTRATION

ProSEM Webinar USA/EU:   REGISTRATION HERE
ProSEM Webinar EU/AP:     REGISTRATION HERE

We look forward to welcoming you to our ProSEM Webinar!